Semiconductor memories technology, testing, and reliability
by
 
Sharma, Ashok K.

Title
: 
Semiconductor memories technology, testing, and reliability

Author
: 
Sharma, Ashok K.

ISBN
: 
9780470546406

Publication Information
: 
Piscataway, N.J. : IEEE Press ; New York : Institute of Electrical and Electronics Engineers, c1997.

Physical Description
: 
1 online resource (xii, 462 p.) : ill.

Subject Term
: 
Semiconductor storage devices.

Genre
: 
Electronic books.

Added Corporate Author
: 
IEEE Solid-State Circuits Council.

Electronic Access
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book249739-1001ONLINEElektronik Kütüphane