Search Results for Semiconductors -- Testing.

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Author

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Alkauskas, Audrius.

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Chakrabarty, Krishnendu, editor of compilation.

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Gao, Jianjun, 1968-

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Goel, Sandeep K, editor of compilation.

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Magonov, Sergei N.

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Schroder, Dieter K.

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Whangbo, Myung-Hwan.

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Wiley InterScience (Online service)

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Semiconductors -- Testing.

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Atomic force microscopy.

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Compound semiconductors -- Mathematical models.

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Compound semiconductors -- Testing.

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Electric insulators and insulation -- Testing.

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Electronic books.

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Field-effect transistors -- Mathematical models.

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Field-effect transistors -- Testing.

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Integrated circuits -- Testing.

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Materials -- Testing -- Mathematical models.

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Metal oxide semiconductors, Complementary -- Testing.

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Metals -- Surfaces -- Analysis.

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Microwave measurements.

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Radio measurements.

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Scanning tunneling microscopy.

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Semiconductors -- Materials -- Testing.

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Semiconductors -- Testing -- Optical methods.

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Semiconductors.

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Surfaces (Technology) -- Analysis.

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1.

Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits

Testing for small-delay defects in nanoscale CMOS integrated circuits

Testing for small-delay defects in nanoscale CMOS integrated circuits

Author

Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.

Preferred Shelf Number

ONLINE(342881.1)

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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Availability

Online Library~1

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Copies:

2.

Cover image for Advanced calculations for defects in materials : electronic structure methods

Advanced calculations for defects in materials : electronic structure methods

Advanced calculations for defects in materials : electronic structure methods

Author

Alkauskas, Audrius.

Preferred Shelf Number

TA410 A379 2011

Format:

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Beytepe Library~1

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3.

Cover image for RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

Author

Gao, Jianjun, 1968- Knovel (Firm)

Preferred Shelf Number

ONLINE

Electronic Access

EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541

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Availability

Online Library~1

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4.

Cover image for Semiconductor material and device characterization

Semiconductor material and device characterization

Semiconductor material and device characterization

Author

Schroder, Dieter K.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928

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Online Library~1

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5.

Cover image for Surface analysis with STM and AFM experimental and theoretical aspects of image analysis

Surface analysis with STM and AFM experimental and theoretical aspects of image analysis

Surface analysis with STM and AFM experimental and theoretical aspects of image analysis

Author

Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9783527615117

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Online Library~1

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6.

Cover image for Principles of semiconductor network testing

Principles of semiconductor network testing

Principles of semiconductor network testing

Author

Afshar, Amir.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

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Online Library~1

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7.

Cover image for Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy

Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy

Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy

Author

Perkowitz, S.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780125507707

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