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13. 
Cover image for Generating Hardware Assertion Checkers For Hardware Verification, Emulation, Post-Fabrication Debugging and On-Line Monitoring
Generating Hardware Assertion Checkers For Hardware Verification, Emulation, Post-Fabrication Debugging and On-Line Monitoring
Author 
Boulé, Marc. author. Zilic, Zeljko. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8586-4
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14. 
Cover image for High-Level Synthesis From Algorithm to Digital Circuit
High-Level Synthesis From Algorithm to Digital Circuit
Author 
Coussy, Philippe. editor. Morawiec, Adam. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-8588-8
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15. 
Cover image for Retargetable Processor System Integration into Multi-Processor System-on-Chip Platforms
Retargetable Processor System Integration into Multi-Processor System-on-Chip Platforms
Author 
Wieferink, Andreas. author. Meyr, Heinrich. author. Leupers, Rainer. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-8652-6
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16. 
Cover image for A practical guide to SysML Systems Model Language
A practical guide to SysML Systems Model Language
Author 
Friedenthal, Sanford. Moore, Alan. Steiner, Rick.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123743794
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17. 
Cover image for BioNanoFluidic MEMS
BioNanoFluidic MEMS
Author 
Hesketh, Peter J. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-46283-7
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18. 
Cover image for FinFETs and Other Multi-Gate Transistors
FinFETs and Other Multi-Gate Transistors
Author 
Colinge, Jean-Pierre. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-71752-4
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19. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71733-3
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20. 
Cover image for Rapid Prototyping of Digital Systems
Rapid Prototyping of Digital Systems
Author 
Hamblen, James O. author. Hall, Tyson S. author. Furman, Michael D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-72671-7
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21. 
Cover image for Physical Limitations of Semiconductor Devices
Physical Limitations of Semiconductor Devices
Author 
Vashchenko, V. A. author. Sinkevitch, V. F. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74514-5
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22. 
Cover image for Wireless Transceiver Systems Design
Wireless Transceiver Systems Design
Author 
Eberle, Wolfgang. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74516-9
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23. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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24. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-75728-5
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