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2013
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Cover image for Surface Tension in Microsystems Engineering Below the Capillary Length
Surface Tension in Microsystems Engineering Below the Capillary Length
Author 
Lambert, Pierre. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334451.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-37552-1
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2. 
Cover image for Advanced In-Flight Measurement Techniques
Advanced In-Flight Measurement Techniques
Author 
Boden, Fritz. editor. Lawson, Nicholas. editor. Jentink, Henk W. editor. Kompenhans, Jürgen. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333886.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-34738-2
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Online Library~1
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