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Cover image for Technology Enhanced Assessment 21st International Conference, TEA 2018, Amsterdam, The Netherlands, December 10–11, 2018, Revised Selected Papers
Technology Enhanced Assessment 21st International Conference, TEA 2018, Amsterdam, The Netherlands, December 10–11, 2018, Revised Selected Papers
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Draaijer, Silvester. editor. (orcid)0000-0003-4230-7740 Joosten-ten Brinke, Desirée. editor. Ras, Eric. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-25264-9
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Cover image for Computer Analysis of Images and Patterns 18th International Conference, CAIP 2019, Salerno, Italy, September 3–5, 2019, Proceedings, Part II
Computer Analysis of Images and Patterns 18th International Conference, CAIP 2019, Salerno, Italy, September 3–5, 2019, Proceedings, Part II
Author 
Vento, Mario. editor. (orcid)0000-0002-2948-741X Percannella, Gennaro. editor. (orcid)0000-0002-1227-0353 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-29891-3
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3. 
Cover image for Touchless Palmprint Recognition Systems
Touchless Palmprint Recognition Systems
Author 
Genovese, Angelo. author. Piuri, Vincenzo. author. Scotti, Fabio. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-10365-5
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4. 
Cover image for Cyberpatterns Unifying Design Patterns with Security and Attack Patterns
Cyberpatterns Unifying Design Patterns with Security and Attack Patterns
Author 
Blackwell, Clive. editor. Zhu, Hong. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-04447-7
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