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1. 
Cover image for Particle Size Measurements Fundamentals, Practice, Quality
Particle Size Measurements Fundamentals, Practice, Quality
Author 
Merkus, Henk G. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9016-5
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2. 
Cover image for Surface and Interface Analysis An Electrochemists Toolbox
Surface and Interface Analysis An Electrochemists Toolbox
Author 
Holze, Rudolf. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-49829-2
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3. 
Cover image for Standardization and Quality Assurance in Fluorescence Measurements II Bioanalytical and Biomedical Applications
Standardization and Quality Assurance in Fluorescence Measurements II Bioanalytical and Biomedical Applications
Author 
Resch-Genger, Ute. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-70571-0
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4. 
Cover image for Standardization and Quality Assurance in Fluorescence Measurements I Techniques
Standardization and Quality Assurance in Fluorescence Measurements I Techniques
Author 
Resch-Genger, Ute. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-75207-3
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5. 
Cover image for Science of Microscopy
Science of Microscopy
Author 
Hawkes, Peter W. editor. Spence, John C. H. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-49762-4
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6. 
Cover image for Very High Resolution Photoelectron Spectroscopy
Very High Resolution Photoelectron Spectroscopy
Author 
Hüfner, Stefan. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-68133-7
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7. 
Cover image for Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques
Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques
Author 
Verma, H. R. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-540-30279-7
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8. 
Cover image for Nanoscale Devices - Fundamentals and Applications
Nanoscale Devices - Fundamentals and Applications
Author 
Gross, Rudolf. editor. Sidorenko, Anatolie. editor. Tagirov, Lenar. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4020-5107-4
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9. 
Cover image for Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering
Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering
Author 
Lecoq, Paul. author. Annenkov, Alexander. author. Gektin, Alexander. author. Korzhik, Mikhail. author. Pedrini, Christian. author.
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ONLINE
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http://dx.doi.org/10.1007/3-540-27768-4
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10. 
Cover image for Integrated Chemical Microsensor Systems in CMOS Technology
Integrated Chemical Microsensor Systems in CMOS Technology
Author 
Hierlemann, Andreas. author. Baltes, H. editor. Fujita, Hiroyuki. editor. Liepmann, Dorian. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138987
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