Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield

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Title:

Author:

Abu-Rahma, Mohamed H. author.

ISBN:

9781461417491

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XVI, 172 p. online resource.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	331282-1001	ONLINE(331282.1)	Searching... Unknown	Searching... Unavailable