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1. 
Cover image for Regression analysis by example
Regression analysis by example
Author 
Chatterjee, Samprit, 1938- Hadi, Ali S. John Wiley & Sons.
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ONLINE
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John Wiley http://dx.doi.org/10.1002/0470055464
http://www3.interscience.wiley.com/cgi-bin/bookhome/112590318
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2. 
Cover image for Regression models for time series analysis
Regression models for time series analysis
Author 
Kedem, Benjamin, 1944- Fokianos, Konstantinos. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0471266981
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley043/2002514463.html
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3. 
Cover image for Nonparametric regression methods for longitudinal data analysis
Nonparametric regression methods for longitudinal data analysis
Author 
Wu, Hulin. Zhang, Jin-Ting, 1964- John Wiley & Sons.
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ONLINE
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John Wiley http://dx.doi.org/10.1002/0470009675
http://www3.interscience.wiley.com/cgi-bin/bookhome/112151850
MyiLibrary, Table of contents http://www.myilibrary.com?id=44838&ref=toc
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4. 
Cover image for Analyzing environmental data
Analyzing environmental data
Author 
Piegorsch, Walter W. Bailer, A. John. John Wiley & Sons.
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ONLINE
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John Wiley http://dx.doi.org/10.1002/0470012234
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5. 
Cover image for Regression with social data modeling continuous and limited response variables
Regression with social data modeling continuous and limited response variables
Author 
DeMaris, Alfred, 1946- John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0471677566
http://www3.interscience.wiley.com/cgi-bin/bookhome/109741980
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6. 
Cover image for Applied logistic regression
Applied logistic regression
Author 
Hosmer, David W. Lemeshow, Stanley. John Wiley & Sons.
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0471722146
http://www3.interscience.wiley.com/cgi-bin/bookhome/109855848
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/00036843.html
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7. 
Cover image for Robust regression and outlier detection
Robust regression and outlier detection
Author 
Rousseeuw, Peter J. Leroy, Annick M. John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0471725382
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