Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Title:
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author:
Im, Seongil. author.
ISBN:
9789400763920
Physical Description:
XI, 101 p. 61 illus. online resource.
Series:
SpringerBriefs in Physics,
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E-Book 336233-1001 ONLINE(336233.1)
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