Cover image for Extreme Statistics in Nanoscale Memory Design
Title:
Extreme Statistics in Nanoscale Memory Design
Author:
Singhee, Amith. editor.
ISBN:
9781441966063
Edition:
1.
Physical Description:
X, 246 p. online resource.
Series:
Integrated Circuits and Systems,
Series Title:
Integrated Circuits and Systems, 1558-9412
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E-Book 172640-2001 ONLINE
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