Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach

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Title:

Author:

Laurila, Tomi. author.

ISBN:

9781447124702

Physical Description:

IX, 217p. 128 illus., 15 illus. in color. online resource.

Series:

Microsystems,

Series Title:

Microsystems, 1389-2134

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	173452-2001	ONLINE	Searching... Unknown	Searching... Unavailable