Trace-Based Post-Silicon Validation for VLSI Circuits

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Title:

Author:

Liu, Xiao. author.

ISBN:

9783319005331

Edition:

1st ed. 2014.

Physical Description:

XV, 108 p. 59 illus., 38 illus. in color. online resource.

Series:

Lecture Notes in Electrical Engineering, 252

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	488098-1001	ONLINE	Searching... Unknown	Searching... Unavailable