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1. 
Cover image for System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
Author 
Kochs, Hans-Dieter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-64991-7
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2. 
Cover image for The Hardware Trojan War Attacks, Myths, and Defenses
The Hardware Trojan War Attacks, Myths, and Defenses
Author 
Bhunia, Swarup. editor. Tehranipoor, Mark M. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-68511-3
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3. 
Cover image for High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
Author 
Wang, Zheng. author. Chattopadhyay, Anupam. author. (orcid)0000-0002-8818-6983 SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-10-1073-6
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4. 
Cover image for Low-Power Design and Power-Aware Verification
Low-Power Design and Power-Aware Verification
Author 
Khondkar, Progyna. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-66619-8
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5. 
Cover image for Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Author 
Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-54422-9
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6. 
Cover image for Fault-Tolerant Design
Fault-Tolerant Design
Author 
Dubrova, Elena. author. SpringerLink (Online service)
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ONLINE(331297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-2113-9
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7. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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8. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8297-1
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9. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
Author 
Cao, Yu. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0445-3
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10. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6993-4
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11. 
Cover image for VLSI 2010 Annual Symposium Selected papers
VLSI 2010 Annual Symposium Selected papers
Author 
Voros, Nikolaos. editor. Mukherjee, Amar. editor. Sklavos, Nicolas. editor. Masselos, Konstantinos. editor. Huebner, Michael. editor.
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http://dx.doi.org/10.1007/978-94-007-1488-5
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12. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Author 
Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3282-9
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