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1. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
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2. 
Cover image for Molecular Electronics Materials, Devices and Applications
Molecular Electronics Materials, Devices and Applications
Author 
Jalabert, Antoine. author. Amara, Amara. author. Clermidy, Fabien. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8594-9
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3. 
Cover image for Memories in Wireless Systems
Memories in Wireless Systems
Author 
Micheloni, Rino. editor. Campardo, Giovanni. editor. Olivo, Piero. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-79078-5
Format: 
Availability 
Online Library~1
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