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1. 
Cover image for LTE-Advanced Relay Technology and Standardization
LTE-Advanced Relay Technology and Standardization
Author 
Yuan, Yifei. author. SpringerLink (Online service)
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ONLINE(333255.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29676-5
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2. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6993-4
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3. 
Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author 
Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9398-1
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4. 
Cover image for Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Author 
Radetzki, Martin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9714-0
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5. 
Cover image for Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author 
Singhee, Amith. author. Rutenbar, Rob A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3100-6
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6. 
Cover image for Advanced Memory Optimization Techniques for Low-Power Embedded Processors
Advanced Memory Optimization Techniques for Low-Power Embedded Processors
Author 
Verma, Manish. author. Marwedel, Peter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5897-4
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7. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-173-3
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8. 
Cover image for Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Functional Verification of Programmable Embedded Architectures A Top-Down Approach
Author 
Mishra, Prabhat. author. Dutt, Nikil D. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137514
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