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1. 
Cover image for Dependable Multicore Architectures at Nanoscale
Dependable Multicore Architectures at Nanoscale
Author 
Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-54422-9
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2. 
Cover image for System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
Author 
Kochs, Hans-Dieter. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-64991-7
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3. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6217-1
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4. 
Cover image for Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Author 
Lukszo, Zofia. editor. Deconinck, Geert. editor. Weijnen, Margot P. C. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3594-3
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5. 
Cover image for Architecting resilient systems accident avoidance and survival and recovery from disruptions
Architecting resilient systems accident avoidance and survival and recovery from disruptions
Author 
Jackson, Scott.
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532
John Wiley http://dx.doi.org/10.1002/9780470544013
http://site.ebrary.com/lib/alltitles/Doc?id=10355233
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6. 
Cover image for Design and Verification of Microprocessor Systems for High-Assurance Applications
Design and Verification of Microprocessor Systems for High-Assurance Applications
Author 
Hardin, David S. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-1539-9
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7. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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8. 
Cover image for Improvement in the Quality of Delivery of Electrical Energy using Power Electronics Systems
Improvement in the Quality of Delivery of Electrical Energy using Power Electronics Systems
Author 
Benysek, Grzegorz. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-84628-649-0
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9. 
Cover image for Writing Testbenches using System Verilog
Writing Testbenches using System Verilog
Author 
Bergeron, Janick. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-31275-7
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