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1. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-00533-1
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2. 
Cover image for Semiconductor Technologies in the Era of Electronics
Semiconductor Technologies in the Era of Electronics
Author 
Kang, Yong Hoon. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-94-017-8768-0
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3. 
Cover image for Exploring Memory Hierarchy Design with Emerging Memory Technologies
Exploring Memory Hierarchy Design with Emerging Memory Technologies
Author 
Sun, Guangyu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-00681-9
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4. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-01165-3
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5. 
Cover image for Recent topics on modeling of semiconductor processes, devices, and circuits
Recent topics on modeling of semiconductor processes, devices, and circuits
Author 
Onur Topaloglu, Rasit. Li, Peng.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500599
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