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1. 
Cover image for Optical techniques for solid-state materials characterization
Optical techniques for solid-state materials characterization
Author 
Prasankumar, Rohit P. Taylor, Antoinette J., 1956-
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2. 
Cover image for Kramers-Kronig Relations in Optical Materials Research
Kramers-Kronig Relations in Optical Materials Research
Author 
Lucarini, Valerio. author. Peiponen, Kai-Erik. author. Saarinen, Jarkko J. author. Vartiainen, Erik M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138913
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3. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-38347-5
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4. 
Cover image for Spectroscopic ellipsometry principles and applications
Spectroscopic ellipsometry principles and applications
Author 
Fujiwara, Hiroyuki. Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/9780470060193
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5. 
Cover image for CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
Author 
Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b139047
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6. 
Cover image for The Physics of Thin Film Optical Spectra An Introduction
The Physics of Thin Film Optical Spectra An Introduction
Author 
Stenzel, Olaf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-27905-9
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7. 
Cover image for Semiconductor Optics
Semiconductor Optics
Author 
Klingshirn, Claus. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b138175
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