System-on-chip test architectures nanometer design for testability
by
 
Wang, Laung-Terng.

Title
: 
System-on-chip test architectures nanometer design for testability

Author
: 
Wang, Laung-Terng.

ISBN
: 
9780123739735
 
9780080556802

Publication Information
: 
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.

Physical Description
: 
1 online resource (xxxvi, 856 p.) : ill.

Series
: 
The Morgan Kaufmann series in systems on silicon

Series Title
: 
The Morgan Kaufmann series in systems on silicon

Subject Term
: 
Systems on a chip -- Testing.
 
Integrated circuits -- Very large scale integration -- Testing.
 
Integrated circuits -- Very large scale integration -- Design.

Added Author
: 
Wang, Laung-Terng.
 
Stroud, Charles E.
 
Touba, Nur A.

Electronic Access
: 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book148557-2001ONLINEElektronik Kütüphane