Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
by
 
Egerton, Ray F. author.

Title
: 
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Author
: 
Egerton, Ray F. author.

ISBN
: 
9780387260167

Physical Description
: 
XII, 202 p. 122 illus. online resource.

Subject Term
: 
Chemistry.
 
Microscopy.
 
Nanotechnology.
 
Surfaces (Physics).

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/b136495


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book165220-2001ONLINEElektronik Kütüphane