Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
by
Egerton, Ray F. author.
Title
:
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
Author
:
Egerton, Ray F. author.
ISBN
:
9780387260167
Physical Description
:
XII, 202 p. 122 illus. online resource.
Subject Term
:
Chemistry.
Microscopy.
Nanotechnology.
Surfaces (Physics).
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 165220-2001 | ONLINE | | Elektronik Kütüphane |