Data Mining and Diagnosing IC Fails
by
Huisman, Leendert M. author.
Title
:
Data Mining and Diagnosing IC Fails
Author
:
Huisman, Leendert M. author.
ISBN
:
9780387263519
Physical Description
:
XIX, 250 p. online resource.
Series
:
Frontiers in Electronic Testing, 31
Series Title
:
Frontiers in Electronic Testing, 0929-1296 ; 31
Subject Term
:
Engineering.
Electronics.
Systems engineering.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 165270-2001 | ONLINE | | Elektronik Kütüphane |