Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
by
Foster, Adam. author.
Title
:
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author
:
Foster, Adam. author.
ISBN
:
9780387372310
Physical Description
:
XIV, 281 p. 116 illus. online resource.
Series
:
NanoScience and Technology,
Series Title
:
NanoScience and Technology, 1434-4904
Subject Term
:
Chemistry.
Microscopy.
Molecular structure.
Particles (Nuclear physics).
Nanotechnology.
Surfaces (Physics).
Added Author
:
Hofer, Werner.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 166196-2001 | ONLINE | | Elektronik Kütüphane |