Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
by
 
Foster, Adam. author.

Title
: 
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Author
: 
Foster, Adam. author.

ISBN
: 
9780387372310

Physical Description
: 
XIV, 281 p. 116 illus. online resource.

Series
: 
NanoScience and Technology,

Series Title
: 
NanoScience and Technology, 1434-4904

Subject Term
: 
Chemistry.
 
Microscopy.
 
Molecular structure.
 
Particles (Nuclear physics).
 
Nanotechnology.
 
Surfaces (Physics).

Added Author
: 
Hofer, Werner.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/0-387-37231-8


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book166196-2001ONLINEElektronik Kütüphane