Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
by
Sachdev, Manoj. editor.
Title
:
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author
:
Sachdev, Manoj. editor.
ISBN
:
9780387465470
Physical Description
:
XXI, 328 p. online resource.
Series
:
Frontiers in Electronic Testing, 34
Series Title
:
Frontiers in Electronic Testing, 0929-1296 ; 34
Subject Term
:
Engineering.
Engineering design.
Electronics.
Systems engineering.
Added Author
:
Gyvez, José Pineda de.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 166351-2001 | ONLINE | | Elektronik Kütüphane |