Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
by
 
Sachdev, Manoj. editor.

Title
: 
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Author
: 
Sachdev, Manoj. editor.

ISBN
: 
9780387465470

Physical Description
: 
XXI, 328 p. online resource.

Series
: 
Frontiers in Electronic Testing, 34

Series Title
: 
Frontiers in Electronic Testing, 0929-1296 ; 34

Subject Term
: 
Engineering.
 
Engineering design.
 
Electronics.
 
Systems engineering.

Added Author
: 
Gyvez, José Pineda de.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/0-387-46547-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book166351-2001ONLINEElektronik Kütüphane