Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
by
 
Tehranipoor, Mohammad. editor.

Title
: 
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability

Author
: 
Tehranipoor, Mohammad. editor.

ISBN
: 
9780387747477

Physical Description
: 
online resource.

Series
: 
Frontiers in Electronic Testing, 37

Series Title
: 
Frontiers in Electronic Testing, 0929-1296 ; 37

Subject Term
: 
Engineering.
 
System safety.
 
Computer engineering.
 
Electronics.
 
Systems engineering.
 
Nanotechnology.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-0-387-74747-7


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book167204-2001ONLINEElektronik Kütüphane