Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
by
Tehranipoor, Mohammad. editor.
Title
:
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author
:
Tehranipoor, Mohammad. editor.
ISBN
:
9780387747477
Physical Description
:
online resource.
Series
:
Frontiers in Electronic Testing, 37
Series Title
:
Frontiers in Electronic Testing, 0929-1296 ; 37
Subject Term
:
Engineering.
System safety.
Computer engineering.
Electronics.
Systems engineering.
Nanotechnology.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 167204-2001 | ONLINE | | Elektronik Kütüphane |