Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices
by
 
Gusev, Evgeni. editor.

Title
: 
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices

Author
: 
Gusev, Evgeni. editor.

ISBN
: 
9781402043673

Physical Description
: 
X, 492 p. online resource.

Series
: 
NATO Science Series II: Mathematics, Physics and Chemistry, 220

Series Title
: 
NATO Science Series II: Mathematics, Physics and Chemistry, 1568-2609 ; 220

Subject Term
: 
Engineering.
 
Condensed matter.
 
Electronics.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/1-4020-4367-8


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book169156-2001ONLINEElektronik Kütüphane