CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
by
 
Pavlov, Andrei. author.

Title
: 
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test

Author
: 
Pavlov, Andrei. author.

ISBN
: 
9781402083631

Physical Description
: 
online resource.

Series
: 
Frontiers In Electronic Testing, 40

Series Title
: 
Frontiers In Electronic Testing, 0929-1296 ; 40

Subject Term
: 
Engineering.
 
Memory management (Computer science).
 
Systems engineering.

Added Author
: 
Sachdev, Manoj.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4020-8363-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book170135-2001ONLINEElektronik Kütüphane