Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by
Bosio, Alberto. author.
Title
:
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author
:
Bosio, Alberto. author.
ISBN
:
9781441909381
Edition
:
1.
Physical Description
:
online resource.
Subject Term
:
Engineering.
Computer aided design.
Systems engineering.
Added Author
:
Dilillo, Luigi.
Girard, Patrick.
Pravossoudovitch, Serge.
Virazel, Arnaud.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 172103-2001 | ONLINE | | Elektronik Kütüphane |