Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by
 
Bosio, Alberto. author.

Title
: 
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Author
: 
Bosio, Alberto. author.

ISBN
: 
9781441909381

Edition
: 
1.

Physical Description
: 
online resource.

Subject Term
: 
Engineering.
 
Computer aided design.
 
Systems engineering.

Added Author
: 
Dilillo, Luigi.
 
Girard, Patrick.
 
Pravossoudovitch, Serge.
 
Virazel, Arnaud.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4419-0938-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book172103-2001ONLINEElektronik Kütüphane