Reliability of Microtechnology Interconnects, Devices and Systems
by
Liu, Johan. author.
Title
:
Reliability of Microtechnology Interconnects, Devices and Systems
Author
:
Liu, Johan. author.
ISBN
:
9781441957603
Edition
:
1.
Physical Description
:
XIII, 204p. 50 illus. online resource.
Subject Term
:
Engineering.
System safety.
Electronics.
Optical materials.
Added Author
:
Salmela, Olli.
Sarkka, Jussi.
Morris, James E.
Tegehall, Per-Erik.
Andersson, Cristina.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 172420-2001 | ONLINE | | Elektronik Kütüphane |