Reliability of Microtechnology Interconnects, Devices and Systems
by
 
Liu, Johan. author.

Title
: 
Reliability of Microtechnology Interconnects, Devices and Systems

Author
: 
Liu, Johan. author.

ISBN
: 
9781441957603

Edition
: 
1.

Physical Description
: 
XIII, 204p. 50 illus. online resource.

Subject Term
: 
Engineering.
 
System safety.
 
Electronics.
 
Optical materials.

Added Author
: 
Salmela, Olli.
 
Sarkka, Jussi.
 
Morris, James E.
 
Tegehall, Per-Erik.
 
Andersson, Cristina.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4419-5760-3


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book172420-2001ONLINEElektronik Kütüphane