Extreme Statistics in Nanoscale Memory Design
by
Singhee, Amith. editor.
Title
:
Extreme Statistics in Nanoscale Memory Design
Author
:
Singhee, Amith. editor.
ISBN
:
9781441966063
Edition
:
1.
Physical Description
:
X, 246 p. online resource.
Series
:
Integrated Circuits and Systems,
Series Title
:
Integrated Circuits and Systems, 1558-9412
Subject Term
:
Engineering.
Electronics.
Systems engineering.
Added Author
:
Rutenbar, Rob A.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 172640-2001 | ONLINE | | Elektronik Kütüphane |