Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
by
 
Walkosz, Weronika. author.

Title
: 
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Author
: 
Walkosz, Weronika. author.

ISBN
: 
9781441978172

Physical Description
: 
XIV, 110 p. online resource.

Series
: 
Springer Theses

Series Title
: 
Springer Theses

Subject Term
: 
Microreactors.
 
Chemistry, Physical organic.
 
Materials.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4419-7817-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book172989-2001ONLINEElektronik Kütüphane