Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach
by
 
Laurila, Tomi. author.

Title
: 
Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach

Author
: 
Laurila, Tomi. author.

ISBN
: 
9781447124702

Physical Description
: 
IX, 217p. 128 illus., 15 illus. in color. online resource.

Series
: 
Microsystems,

Series Title
: 
Microsystems, 1389-2134

Subject Term
: 
Engineering.
 
Optical materials.
 
Surfaces (Physics).

Added Author
: 
Vuorinen, Vesa.
 
Paulasto-Kröckel, Mervi.
 
Turunen, Markus.
 
Mattila, Toni T.
 
Kivilahti, Jorma.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4471-2470-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book173452-2001ONLINEElektronik Kütüphane