Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
by
 
Shen, Ruijing. author.

Title
: 
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Author
: 
Shen, Ruijing. author.

ISBN
: 
9781461407881

Physical Description
: 
XXXI, 305p. 104 illus. online resource.

Subject Term
: 
Engineering.
 
Computer aided design.
 
Systems engineering.

Added Author
: 
Tan, Sheldon X.-D.
 
Yu, Hao.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4614-0788-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book173778-2001ONLINEElektronik Kütüphane