Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
by
 
Rein, Stefan. author.

Title
: 
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications

Author
: 
Rein, Stefan. author.

ISBN
: 
9783540279228

Physical Description
: 
XXVI, 489 p. 153 illus. online resource.

Series
: 
Springer Series in Material Science, 85

Series Title
: 
Springer Series in Material Science, 0933-033X ; 85

Subject Term
: 
Physics.
 
Particles (Nuclear physics).
 
Optical materials.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/3-540-27922-9


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book181606-2001ONLINEElektronik Kütüphane