Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
by
 
Kaupp, Gerd. author.

Title
: 
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Author
: 
Kaupp, Gerd. author.

ISBN
: 
9783540284727

Physical Description
: 
XII, 292 p. 239 illus. online resource.

Subject Term
: 
Chemistry.
 
Chemistry, Physical organic.
 
Biochemistry.
 
Life sciences.
 
Physical optics.
 
Nanotechnology.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-3-540-28472-7


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book181752-2001ONLINEElektronik Kütüphane