Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
by
Kaupp, Gerd. author.
Title
:
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces
Author
:
Kaupp, Gerd. author.
ISBN
:
9783540284727
Physical Description
:
XII, 292 p. 239 illus. online resource.
Subject Term
:
Chemistry.
Chemistry, Physical organic.
Biochemistry.
Life sciences.
Physical optics.
Nanotechnology.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 181752-2001 | ONLINE | | Elektronik Kütüphane |