Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
by
 
Yeung, Dit-Yan. editor.

Title
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Author
Yeung, Dit-Yan. editor.

ISBN
9783540372417

Physical Description
XXI, 939 p. Also available online. online resource.

Series
Lecture Notes in Computer Science, 4109

Series Title
Lecture Notes in Computer Science, 0302-9743 ; 4109

Subject Term
Computer science.
 
Computational complexity.
 
Artificial intelligence.
 
Computer graphics.
 
Computer vision.
 
Optical pattern recognition.

Added Author
Kwok, James T.
 
Fred, Ana.
 
Roli, Fabio.
 
Ridder, Dick.

Added Corporate Author
SpringerLink (Online service)

Electronic Access
http://dx.doi.org/10.1007/11815921


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book184510-2001ONLINEElektronik Kütüphane