Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
by
 
Schubert, Mathias. author.

Title
: 
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons

Author
: 
Schubert, Mathias. author.

ISBN
: 
9783540447016

Physical Description
: 
XI, 193 p. 77 illus. online resource.

Series
: 
Springer Tracts in Modern Physics, 209

Series Title
: 
Springer Tracts in Modern Physics, 0081-3869 ; 209

Subject Term
: 
Chemistry.
 
Physical optics.
 
Optical materials.
 
Surfaces (Physics).

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/b11964


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book184793-2001ONLINEElektronik Kütüphane