Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials
by
 
Breitenstein, Otwin. author.

Title
: 
Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials

Author
: 
Breitenstein, Otwin. author.

ISBN
: 
9783642024177

Physical Description
: 
X, 258 p. online resource.

Series
: 
Springer Series in Advanced Microelectronics, 10

Series Title
: 
Springer Series in Advanced Microelectronics, 1437-0387 ; 10

Subject Term
: 
Physics.
 
Engineering.
 
Materials.
 
Surfaces (Physics).

Added Author
: 
Warta, Wilhelm.
 
Langenkamp, Martin.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-3-642-02417-7


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book190315-2001ONLINEElektronik Kütüphane