Journey to data quality
by
 
Lee, Yang W.

Title
: 
Journey to data quality

Author
: 
Lee, Yang W.

ISBN
: 
9780262256544

Publication Information
: 
Cambridge, Mass. : MIT Press, c2006.

Physical Description
: 
1 online resource (xii, 226 p.) : ill.

Subject Term
: 
Business -- Data processing -- Management.
 
Database management -- Quality control.

Added Author
: 
Lee, Yang W.

Electronic Access
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267297


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book219993-1001ONLINEElektronik Kütüphane