Logic testing and design for testability
by
 
Fujiwara, Hideo.

Title
: 
Logic testing and design for testability

Author
: 
Fujiwara, Hideo.

ISBN
: 
9780262256186

Publication Information
: 
Cambridge, Mass. : MIT Press, c1985.

Physical Description
: 
1 online resource (x, 284 p.) : ill.

Series
: 
MIT Press series in computer systems

Series Title
: 
MIT Press series in computer systems

Subject Term
: 
Logic circuits -- Testing.
 
Integrierte Schaltung.
 
Test.
 
VLSI.

Electronic Access
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book220153-1001ONLINEElektronik Kütüphane