LSI/VLSI testability design
by
Tsui, Frank F.
Title
:
LSI/VLSI testability design
Author
:
Tsui, Frank F.
ISBN
:
9780070653412
Publication Information
:
New York : McGraw-Hill, 1987.
Physical Description
:
xii, 702 s.
Subject Term
:
İNTEGRE DEVRELER -- ÇOK GENİŞ KAPSAMLI -- TEST ETME.
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Beytepe Library | Book | 7.2/12/592377 | TH 7874 T78 1987 | | Beytepe Genel Koleksiyon |