Reliability wearout mechanisms in advanced CMOS technologies
by
Strong, Alvin Wayne, 1946-
Title
:
Reliability wearout mechanisms in advanced CMOS technologies
Author
:
Strong, Alvin Wayne, 1946-
ISBN
:
9780470455265
9780470455258
Publication Information
:
Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley, c2009.
Physical Description
:
1 online resource (xv, 624 p.) : ill.
Series
:
IEEE Press series on microelectronic systems
IEEE Press series on microelectronic systems.
Subject Term
:
Metal oxide semiconductors, Complementary -- Reliability.
TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
TECHNOLOGY & ENGINEERING -- Electronics -- Digital.
CMOS-Schaltung.
Schaltungsentwurf.
Genre
:
Electronic books.
Added Author
:
Strong, Alvin Wayne, 1946-
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 249574-1001 | ONLINE | | Elektronik Kütüphane |