Semiconductor memories technology, testing, and reliability
by
Sharma, Ashok K.
Title
:
Semiconductor memories technology, testing, and reliability
Author
:
Sharma, Ashok K.
ISBN
:
9780470546406
Publication Information
:
Piscataway, N.J. : IEEE Press ; New York : Institute of Electrical and Electronics Engineers, c1997.
Physical Description
:
1 online resource (xii, 462 p.) : ill.
Subject Term
:
Semiconductor storage devices.
Genre
:
Electronic books.
Added Corporate Author
:
IEEE Solid-State Circuits Council.
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 249739-1001 | ONLINE | | Elektronik Kütüphane |