Transient-induced latchup in CMOS integrated circuits
by
 
Ker, Ming-Dou.

Title
: 
Transient-induced latchup in CMOS integrated circuits

Author
: 
Ker, Ming-Dou.

ISBN
: 
9780470824085

Publication Information
: 
Singapore ; Hoboken, NJ : Wiley ; [Piscataway, NJ] : IEEE Press, c2009.

Physical Description
: 
1 online resource (xiii, 249 p.) : ill.

Subject Term
: 
Metal oxide semiconductors, Complementary -- Defects.
 
Metal oxide semiconductors, Complementary -- Reliability.
 
COMPUTERS / Logic Design
 
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic
 
TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI

Genre
: 
Electronic books.

Added Author
: 
Hsu, Sheng-Fu.

Electronic Access
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book249785-1001ONLINEElektronik Kütüphane