Transient-induced latchup in CMOS integrated circuits
by
Ker, Ming-Dou.
Title
:
Transient-induced latchup in CMOS integrated circuits
Author
:
Ker, Ming-Dou.
ISBN
:
9780470824085
Publication Information
:
Singapore ; Hoboken, NJ : Wiley ; [Piscataway, NJ] : IEEE Press, c2009.
Physical Description
:
1 online resource (xiii, 249 p.) : ill.
Subject Term
:
Metal oxide semiconductors, Complementary -- Defects.
Metal oxide semiconductors, Complementary -- Reliability.
COMPUTERS / Logic Design
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic
TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI
Genre
:
Electronic books.
Added Author
:
Hsu, Sheng-Fu.
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 249785-1001 | ONLINE | | Elektronik Kütüphane |